Please use this identifier to cite or link to this item:
http://localhost:8080/xmlui/handle/123456789/1776
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | MECE | - |
dc.date.accessioned | 2017-09-18T05:22:29Z | - |
dc.date.available | 2017-09-18T05:22:29Z | - |
dc.date.issued | 2017-02 | - |
dc.identifier.uri | http://hdl.handle.net/123456789/1776 | - |
dc.language.iso | en_US | en_US |
dc.title | VLSI Testing and Verification | en_US |
Appears in Collections: | 2nd Year |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
third sem 2017 a.pdf | 38.32 kB | Adobe PDF | View/Open |
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